Structural modification of poly(methyl methacrylate) by proton irradiation

H. W. Choi, H. J. Woo,W. Hong, J. K. Kim, S. K. Lee* and C. H. Eum

Korea Institute of Geology Mining and Materials, Taejon 305-350, Korea
*Department of Chemistry, Taejon University, Taejon 300-716, Korea


Abstract

A general survey is presented on the structural modification of poly(methyl methacrylate) by proton implantation. The implanted PMMA films were characterized by FT-IR ATR, Raman, RBS, GPC and surface profiling. Ion fluence of 350 keV proton ranged from 2Ąż1014 to 1Ąż1015 ions/cm2. The IR and Raman spectra showed the reduction of peaks from the pendant group of PMMA. The change of absorption and composition was observed by UV-VIS and RBS, respectively. The change of molecular weight distribution was also measured by GPC and G-value of scission was estimated. The results of these analyses may be useful for the design of polymeric optical devices and lithography with proton implantation.

Applied Surface Science, 169-170(2001)433.

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