aDepartment of Applied Chemistry, School of Engineering, The university of Tokyo, Hongo, Bunkyo, Tokyo 113-8656, Japan
bDepartment of Materials Science and Engineering, Kyoto University, Sakyo-ku, Kyoto 606-8501, Japan
cJASRI, SPring-8, Kamigori, Hyogo 679-5198, Japan
A wavelength dispersive X-ray spectrometer is designed and developed for X-ray fluorescence analysis and spectroscopy using a X-ray microprobe at SPring-8 BL39XU. The spectrometer uses a flat analyzer crystal, and X-rays from a small beam spot are dispersed by the crystal onto a position sensitive proportional counter. The energy resolution of the spectrometer is determined by the spatial resolution of the position sensitive proportional counter, and the additional use of the slit-scan can improve the energy resolution if necessary. Performance of the spectrometer is evaluated by using a conventional X-ray source, and preliminary experimental results of the X-ray microprobe by using brilliant hard X-ray from an X-ray undulator are repoted.
Spectrochim. Acta B54(1999)171.
full paper download