A wavelength dispersive X-ray spectrometer for small area X-ray fluorescence spectroscopy at SPring-8 BL39XU

Shinjiro Hayakawaa, Akihisa Yamaguchia, Wan Honga, Yohichi Gohshia, Tokujiro Yamamotob, Kouichi Hayashib, Jun Kawaib, Shunji Gotoc

aDepartment of Applied Chemistry, School of Engineering, The university of Tokyo, Hongo, Bunkyo, Tokyo 113-8656, Japan
bDepartment of Materials Science and Engineering, Kyoto University, Sakyo-ku, Kyoto 606-8501, Japan
cJASRI, SPring-8, Kamigori, Hyogo 679-5198, Japan


A wavelength dispersive X-ray spectrometer is designed and developed for X-ray fluorescence analysis and spectroscopy using a X-ray microprobe at SPring-8 BL39XU. The spectrometer uses a flat analyzer crystal, and X-rays from a small beam spot are dispersed by the crystal onto a position sensitive proportional counter. The energy resolution of the spectrometer is determined by the spatial resolution of the position sensitive proportional counter, and the additional use of the slit-scan can improve the energy resolution if necessary. Performance of the spectrometer is evaluated by using a conventional X-ray source, and preliminary experimental results of the X-ray microprobe by using brilliant hard X-ray from an X-ray undulator are repoted.

Spectrochim. Acta B54(1999)171.

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